Binary Classifier

Using multiple classifiers we verify the feasibility of using metadata from synthetic datasets modeled by a characterization of a few large software repositories and developer profiles. Results show that the metadata-based learning approach appears promising towards early flagging of potentially buggy commits in software repositories.

We present preliminary results from characterizing the distribution of 452 million commits in a metadata listing from GitHub repositories. Based on multiple distributions, we find the best fits and second best fits across different ranges in the data. The characterization is aimed at synthetic repository generation suitable for use in simulation and machine learning.